Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry
| dc.contributor.area | Gerencia Tecnológica y/o Tecnología | |
| dc.contributor.author | Sainz, Carmen | |
| dc.contributor.author | Calatroni, José | |
| dc.contributor.author | Escalona, Rafael | |
| dc.contributor.department | Departamento de Física | |
| dc.contributor.faculty | Facultad de Ciencias | |
| dc.date.available | 2024-04-18T10:09:35Z | |
| dc.date.issued | 2001 | |
| dc.format.extent | págs. 169 a 178 | |
| dc.identifier.uri | https://saber.unimet.edu.ve/handle/20.500.14516/992 | |
| dc.language.iso | eng | |
| dc.publication.title | Proceedings of SPIE: Optical Diagnostics for fluids, solids and combustion Vol. 4448 | |
| dc.title | Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry |