Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry
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Identifiers
Dates:
2001
Journal Title
Journal ISSN
Volume Title
Publisher
Citations
Abstract
Resumen
Description
item.page.area.name
46th Annual Meeting of SPIE (The International Society for Optical Engineering)
Place:
San Diego, California, Estados Unidos
Dates:
2001
Keywords
Citation
Area
Gerencia Tecnológica y/o Tecnología
Faculty
Facultad de Ciencias
Department
Departamento de Física