Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry
| dc.conference.date | 2001 | |
| dc.conference.name | 46th Annual Meeting of SPIE (The International Society for Optical Engineering) | |
| dc.conference.place | San Diego, California, Estados Unidos | |
| dc.contributor.area | Gerencia Tecnológica y/o Tecnología | |
| dc.contributor.author | Sainz, Carmen | |
| dc.contributor.author | Calatroni, José | |
| dc.contributor.author | Escalona, José | |
| dc.contributor.department | Departamento de Física | |
| dc.contributor.faculty | Facultad de Ciencias | |
| dc.date.available | 2024-04-24T20:25:17Z | |
| dc.date.issued | 2001 | |
| dc.description.abstract | Resumen | |
| dc.identifier.uri | https://saber.unimet.edu.ve/handle/20.500.14516/3547 | |
| dc.title | Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry |