Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry
No Thumbnail Available
Identifiers
Dates:
2001
Journal Title
Journal ISSN
Volume Title
Publisher
Citations
Abstract
Description
item.page.area.name
Place:
Dates:
Keywords
Citation
Area
Gerencia Tecnológica y/o Tecnología
Faculty
Facultad de Ciencias
Department
Departamento de Física